Product Application Examples SAMPLE
- Laser / optics related equipment, optical alignment
- Precision scanning and mapping measurements
- Objective Lens Focus Applications
- Ultra-precision nano machining / high-speed cut machining
- Various precision positioning applications
- Detection and measurement of minute forces at the ΜN (mg) level
- Highly sensitive force measurement while maintaining high rigidity
- Equipment/Unit Design Fabrication Examples
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                    Laser / optics related equipment, optical alignment- 
                              Mirror fine-tuning of interferometerMirrors can be controlled with high precision to a fineness of several hundredths of a wavelength, and optical systems using interference can also be measured stably. 
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                              Transmission optical elements alignmentOpenings can be easily provided even in a small body, making it suitable for positioning optical devices that transmit laser light, etc. 
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                              Optical fiber optical axis adjustmentOptical fibers can be aligned with high accuracy and high speed in the XYZ axis, making it easy to find the peak point of incoming light. 
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                              Mirror scanning for laser machiningDesigns with water-cooled flow paths are also available to suppress heat generation in the reflecting mirror due to high-power lasers. 
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                              Lithography circuit board alignmentThe XY axis stage has a large opening of 200 mm square, allowing circular motion while transmitting light to the glass substrate. 
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                              Optical mirror high-precision angle adjustmentThe mirror can be fine-tuned in angular resolution on the order of μrad (micro rad), making it optimal for alignment of confocal optics. 
 
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                    Precision scanning and mapping measurements- 
                              CCD pixel shift (pixel shift)It can also be applied to CCD pixel shifting (pixel displacement) used for high-resolution imaging. 
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                              Sample tables for microscopes and analytical instrumentsSuitable for use on sample tables of analytical instruments such as Raman and spectroscopy to obtain high-precision 2D mapping images. 
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                            Probe microscope, AFM/SPMClosed-loop control using a built-in displacement sensor enables more precise image acquisition and accurate movement to the target position compared to a tube scanner. 
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                            Mapping MeasurementUltra-high resolution mapping of small areas by piezo stage and wide range of high precision mapping by piezo motor stage are available. 
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                            Semiconductor and LCD related equipmentAlignment marks between devices can be aligned with high precision. 
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                            Nanometer scanningSmooth and reliable scanning operation that follows command signals such as sinusoidal wave and square wave is possible. 
 
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                    Objective Lens Focus Applications- 
                              Microscope High Speed FocusPiezo stages are also suitable for fast AF to follow the undulations of the observation device. Special lenses are also available. 
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                              Image Processing ApplicationReal-time images with a deep depth of focus can be obtained by superimposing slice images acquired with a high-speed camera while moving the objective lens at several tens of Hz. 
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                            Interference form measurementThe high resolution of the piezo stage is also suitable for shape measurement using the principle of interference. 
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                            Semiconductor and FPD inspection equipmentWe offer optimal design using piezoelectric elements to achieve the high precision required by miniaturization and the high speed required by tact time. 
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                            Laser machiningFocus adjustment of optical lenses in laser processing is also performed with high speed and high precision. 
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                            Confocal MicroscopeThe mirror can be fine-tuned back and forth in the nm (nanometer) range and angular fine-tuning in the μrad (micro rad) level with high resolution, making it optimal for alignment of confocal optics. 
 
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                    Ultra-precision nano machining / high-speed cut machining- 
                              FTSUltra-precision machining is achieved by using a piezo stage for fine cutting of tools for faster machining speeds and higher accuracy. 
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                              Diamond Turning Tool Precision FeedingIt can also be applied to the machining of non-axisymmetric free-form surfaces that accompany the increasing sophistication of optical devices. 
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                            Precision die machiningThe cutting edge of the tool is precisely aligned with the rotational axis of the workpiece and has the rigidity to maintain a stable posture during machining. 
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                            Precise positioning of workpiecesIt can also be applied to the continuous and repeated movement of the workpiece and punch press. 
 
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                    Various precision positioning applications- 
                              HDD TesterThe magnetic head can be applied to investigation, analysis, etc. by obtaining a signal of the disk while moving with ultra-high accuracy on the piezo stage. 
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                              Microscopic specimen tensile, compressionMicro specimens are subjected to tension or compression on a piezo stage, which can be applied to acquire data from the elastic range to the plastic range to rupture. 
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                              High Precision Parallel Surface AlignmentThe 2-axis tilting stage enables high-precision plane alignment before pressing. 
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                              Friction and Wear TestThe piezo stage vibrates the specimen precisely at a fixed period to test the amount of wear on the specimen and the mating material. 
 
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                    Detection and measurement of minute forces at the μN (mg) level- 
                              Micro-pressure load measurementEven minute forces at the μN to mN level can be measured with high sensitivity. 
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                              Optical fiber and functional devices contact detectionIt can also be used as a high-precision touch sensor between devices. 
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                              Spring Probe Spring Pressure Test MeasurementIt is possible to measure with high sensitivity even springs with small elastic force that are difficult to measure with load cells. 
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                              Probing contact detection on semiconductor devicesProbing of device electrode surfaces for failure analysis, etc., also captures the moment of contact with high sensitivity. 
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                            Micro Actuator Thrust MeasurementIt can also be applied to thrust inspection and measurement of small motors and actuators. 
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                            Tensile and rupture force measurementTensile and rupture forces of minute specimens such as fibers, which are difficult to measure with ordinary testing equipment, can be measured with high sensitivity. 
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                            Needle tip puncture force into cellsIt measures the puncture force when inserting a needle into a cell, membrane, etc. 
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                            Micro friction force, thrust monitorForce applied during peeling of thin films, etc. can be measured. 
 
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                    Highly sensitive force measurement while maintaining high rigidity- 
                              Workpiece and Diamond Turning Tool Contact Load MeasurementThe cutting force when the bite tip contacts the rotating workpiece can be measured. 
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                              Frontal Turning Cutting Resistance MeasurementDetects the force received by the diamond turning tool during the frontal turning process. 
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                            Cutting and grinding force measurement during precision machiningThe grinding wheel measures the state of surface polishing and makes it possible to determine the state of the machining process. 
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                            Contact detection between bite cutting edge and workpieceAir cutting time in the proximity of the bite cutting edge and the workpiece can be reduced. 
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                            Pressure and hardness controlBy measuring the reaction force when a certain amount is pressed, it is possible to manage the pressing pressure and reaction force (hardness). 
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                            Friction force measurementPressure can be monitored during pressing. 
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                            Thrust and Reaction MonitorIt is possible to numerically monitor the thrust of the drive source and the resulting reaction force. 
 
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                    Equipment/Unit Design Fabrication Examples- 
                              SAICASCuts from the surface to the interior of the material and evaluates the mechanical characteristics of the material based on 
 depth and cutting force during the cut.- 
                                        Application ExamplesResist film, optical film, plating film, ultra-surface layer of polymer materials, etc. 等 
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                                        Equipment ProvisionDaipla Wintes Co., Ltd. 
 
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                              Current path imaging equipmentNon-destructive imaging of batteries and electronic devices - 
                                        Application Examples・Identification of abnormalities in the internal electrodes of lithium-ion battery packages 
 ・Diagnostic imaging of defective locations on printed circuit boards with complex wiring patterns
 ・Identification of self-discharge locations
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                                        Equipment ProvisionIntegral Geometry Science Inc. 
 
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